Local defects present in CeO 2-x films result in a mixture of Ce 3+ and Ce 4+ oxidation states. Previous studies of the Ce 3d region with XPS have shown that depositing metal nanoparticles on ceria films causes further reduction, with an increase in Ce 3+ concentration. Here, we compare the use of XPS and resonant photoemission spectroscopy (RESPES) to estimate the concentration of Ce 3+ and Ce 4+ in CeO 2-x films grown on Pt (111), and the variation of this concentration as a function of Pd deposition. Due to the nature of the electronic structure of CeO 2-x , resonant peaks are observed for the 4d-4f transitions when the photon energy matches the resonant energy; (hν=121.0 eV) for Ce 3+ and (hν=124.5 eV) for Ce 4+. This results in two discrete resonant photoemission peaks in valence band spectra. The ratio of the difference of these peaks with off-resonance scans gives an indication of the relative contribution of Ce 3+. Results from RESPES indicate reduction of CeO 2-x on deposition of Pd, confirming earlier findings from XPS studies.