X-ray emission from highly-charged ions after electron transfer in slow collisions: the role of multiple capture processes - Archive ouverte HAL
Article Dans Une Revue Journal of Physics: Conference Series Année : 2014

X-ray emission from highly-charged ions after electron transfer in slow collisions: the role of multiple capture processes

Résumé

We have studied 15 keV/q Ar17+ impact on atomic AT experimentally and theoretically. Our analysis shows that multiple capture processes followed by autoionization contribute strongly to the measured Lyman ay emission intensities in the heliumlike projectile.
Fichier principal
Vignette du fichier
document-3.pdf (82.79 Ko) Télécharger le fichier
Origine Publication financée par une institution
Loading...

Dates et versions

hal-01245579 , version 1 (04-01-2016)

Licence

Identifiants

Citer

A. Salehzadeh, Martino Trassinelli, Christophe Prigent, E. Lamour, J. -P. Rozet, et al.. X-ray emission from highly-charged ions after electron transfer in slow collisions: the role of multiple capture processes. Journal of Physics: Conference Series, 2014, 488 (Section 8), pp.082006. ⟨10.1088/1742-6596/488/8/082006⟩. ⟨hal-01245579⟩
111 Consultations
80 Téléchargements

Altmetric

Partager

More