Direct Copper Bonding for Power Interconnects: Design, Manufacturing, and Test - Archive ouverte HAL
Article Dans Une Revue IEEE Transactions on Components, Packaging and Manufacturing Technology. Part A, Manufacturing Technology Année : 2015

Direct Copper Bonding for Power Interconnects: Design, Manufacturing, and Test

Résumé

3-D power module structures allow for better cooling and lower parasitic inductances compared with the classical planar technology. In this paper, we present a 3-D technology that uses an innovative assembly method (direct copper-to-copper bonding). The concept and manufacturing process of this technology is described in detail. An accurate electrical characterization is then performed to compare its performance with that of the classical planar structures.
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Dates et versions

hal-01207014 , version 1 (30-09-2015)

Identifiants

Citer

Bassem Mouawad, Benoit Thollin, Cyril Buttay, Laurent Dupont, Vincent Bley, et al.. Direct Copper Bonding for Power Interconnects: Design, Manufacturing, and Test. IEEE Transactions on Components, Packaging and Manufacturing Technology. Part A, Manufacturing Technology, 2015, 5 (1), pp.143-150. ⟨10.1109/TCPMT.2014.2376882⟩. ⟨hal-01207014⟩
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