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Article Dans Une Revue Journal of Synchrotron Radiation Année : 2014

Scanning force microscope for in situ nanofocused X-ray diffraction studies

Résumé

A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials.
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Dates et versions

hal-01120052 , version 1 (17-01-2018)

Identifiants

Citer

Zhe Ren, Francesca Mastropietro, Anton Davydok, Simon Langlais, Marie-Ingrid Richard, et al.. Scanning force microscope for in situ nanofocused X-ray diffraction studies. Journal of Synchrotron Radiation, 2014, 21 (5), pp.1128-1133. ⟨10.1107/s1600577514014532⟩. ⟨hal-01120052⟩
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