Phase unwrapping for dual-beam electronic speckle pattern interferometry: method - Archive ouverte HAL Access content directly
Journal Articles Applied optics Year : 1997

Phase unwrapping for dual-beam electronic speckle pattern interferometry: method

Abstract

A new algorithm to reveal the order and sign of fringes formed by dual-beam electronic speckle-pattern interferometry is described. When combined with a previously reported phase-extraction method, it makes possible the evaluation of displacement absolutely and continuously over the entire surface of the object from a total of five frames. This technique is particularly useful when displacement is spatially discontinuous and temporally fast and the amount of data is large. A model experiment showing the validity of this method is presented.
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Dates and versions

hal-01092321 , version 1 (08-12-2014)

Identifiers

  • HAL Id : hal-01092321 , version 1

Cite

S Yoshida, Dr. Suprapedi, R. Widiastuti, Dr. Marincan, Dr. Septriyanti, et al.. Phase unwrapping for dual-beam electronic speckle pattern interferometry: method. Applied optics, 1997, 36 (1), pp.266-270. ⟨hal-01092321⟩
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