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Article Dans Une Revue Applied optics Année : 1997

Phase unwrapping for dual-beam electronic speckle pattern interferometry: method

Résumé

A new algorithm to reveal the order and sign of fringes formed by dual-beam electronic speckle-pattern interferometry is described. When combined with a previously reported phase-extraction method, it makes possible the evaluation of displacement absolutely and continuously over the entire surface of the object from a total of five frames. This technique is particularly useful when displacement is spatially discontinuous and temporally fast and the amount of data is large. A model experiment showing the validity of this method is presented.
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Dates et versions

hal-01092321 , version 1 (08-12-2014)

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  • HAL Id : hal-01092321 , version 1

Citer

S Yoshida, Dr. Suprapedi, R. Widiastuti, Dr. Marincan, Dr. Septriyanti, et al.. Phase unwrapping for dual-beam electronic speckle pattern interferometry: method. Applied optics, 1997, 36 (1), pp.266-270. ⟨hal-01092321⟩
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