Effect of interface configurations on the dynamic scaling behavior of Pb(Zr0.53Ti0.47)O3 thin films - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Physics Letters Année : 2014

Effect of interface configurations on the dynamic scaling behavior of Pb(Zr0.53Ti0.47)O3 thin films

Résumé

The ferroelectric hysteresis and the scaling relations of hysteresis area ⟨A⟩ against field amplitude E and frequency f in Pb(Zr0.53Ti0.47)O3 thin films using platinum and LaNiO3 (LNO) as both bottom and top electrodes were systematically investigated. Interestingly, it was found that the influence of top electrodes is dominant in affecting the scaling behavior of the dynamic hysteresis, which may be the result of the asymmetric interface structure deriving from the differences in conductivity and crystallization of the top and bottom LNO electrodes. The bottom electrodes affect the scaling behavior slightly via influencing the micro-structural and level of space charge. © 2014 AIP Publishing LLC
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hal-00957814 , version 1 (27-05-2022)

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Kui Li, Nossikpendou Sama, Tao Li, Denis Remiens, Gang Du, et al.. Effect of interface configurations on the dynamic scaling behavior of Pb(Zr0.53Ti0.47)O3 thin films. Applied Physics Letters, 2014, 104, 092904, 5 p. ⟨10.1063/1.4867506⟩. ⟨hal-00957814⟩
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