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Communication Dans Un Congrès Année : 2011

Characterization of high permittivity substrates by a thickness resonance method

Hussain Alaaeddine
  • Fonction : Auteur
  • PersonId : 919417
Olivier Tantot
Michel Aubourg
  • Fonction : Auteur
  • PersonId : 915586
Serge Verdeyme
  • Fonction : Auteur
  • PersonId : 915587

Résumé

In order to characterize dielectric materials having very high permittivity (εr ≈ 40-140) through a non destructive method, and derived from a resonant cavity is proposed and the determination uncertainties are evaluated.
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Dates et versions

hal-00684724 , version 1 (03-04-2012)

Identifiants

  • HAL Id : hal-00684724 , version 1

Citer

Hussain Alaaeddine, Olivier Tantot, Michel Aubourg, Serge Verdeyme. Characterization of high permittivity substrates by a thickness resonance method. EuMW 2011, Manchester European Microwave Week 2011, Oct 2011, Manchester, United Kingdom. pp.206 - 209. ⟨hal-00684724⟩

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