Conference Papers
Year : 2002
Christophe Vignat : Connect in order to contact the contributor
https://hal.science/hal-00621814
Submitted on : Sunday, September 11, 2011-1:14:31 PM
Last modification on : Friday, March 24, 2023-2:52:54 PM
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- HAL Id : hal-00621814 , version 1
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F. Sagnard, D. Seetharamdoo, Christophe Vignat. Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments. 32nd EUMC, Sep 2002, Milan, France. 10pp. ⟨hal-00621814⟩
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