Conference Papers
Year : 2002
Christophe Vignat : Connect in order to contact the contributor
https://hal.science/hal-00621814
Submitted on : Sunday, September 11, 2011-1:14:31 PM
Last modification on : Thursday, May 16, 2024-3:00:04 PM
Dates and versions
Identifiers
- HAL Id : hal-00621814 , version 1
Cite
F. Sagnard, D. Seetharamdoo, Christophe Vignat. Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments. 32nd EUMC, Sep 2002, Milan, France. 10pp. ⟨hal-00621814⟩
Collections
46
View
0
Download