Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments - Archive ouverte HAL Access content directly
Conference Papers Year : 2002

Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

F. Sagnard
  • Function : Author
D. Seetharamdoo
Christophe Vignat
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hal-00621814 , version 1 (11-09-2011)

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  • HAL Id : hal-00621814 , version 1

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F. Sagnard, D. Seetharamdoo, Christophe Vignat. Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments. 32nd EUMC, Sep 2002, Milan, France. 10pp. ⟨hal-00621814⟩
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