Diffraction peaks restoration and extraction in energy dispersive X-ray diffraction
Résumé
This paper proposes a method to restore energy dispersive X-ray diffraction (EDXRD) spectra and to extract diffraction peaks. It follows a maximum a posteriori approach using a physical model of the formation of the EDXRD data to remove blur caused by both the detector and the coarse angular resolution of X-ray tube based EDXRD setups. It separates peaks caused by the diffraction by crystalline material from a countinuous background. Tested on real data (graphite and NaCl), our algorithm acheived to detect diffraction peaks with a good precision (about 1 keV depending on the peak position) even at high energy where very few photons were measured.
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