A Load Effect Evaluation of a Transmission Line Exciting Chamber - Archive ouverte HAL
Article Dans Une Revue Journal of Microwaves, Optoelectronics and Electromagnetic Applications Année : 2011

A Load Effect Evaluation of a Transmission Line Exciting Chamber

Résumé

This paper presents an evaluation of the phase shifting excitation and load effects in a Transmission Line Exciting Chamber. This chamber is suggested as an alternative for immunity tests because of the restrictions related to canonical chambers. Here, two methods are used to calculate the E-field: a semi-analytic approach and a numerical one. The semi-analytic method is based on the modal expansion while a software is used for numerical simulations. The results regarding the E-field profile and the related statistical indexes of merit are presented and used to evaluate the chamber performances. Experiments were also conducted in order to evaluate the chamber.

Dates et versions

hal-00577860 , version 1 (17-03-2011)

Identifiants

Citer

Mario Alves dos Santos Junior, Damien Voyer, Ronan Perrussel, Djonny Weinzierl, Carlos Antonio França Sartori, et al.. A Load Effect Evaluation of a Transmission Line Exciting Chamber. Journal of Microwaves, Optoelectronics and Electromagnetic Applications, 2011, 10 (1), pp.42-54. ⟨10.1590/S2179-10742011000100005⟩. ⟨hal-00577860⟩
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