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Article Dans Une Revue Microelectronics Reliability Année : 2010

Wearout estimation using the Robustness Validation methodology for components in 150 °C ambient automotive applications

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hal-00549502 , version 1 (22-12-2010)

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P. Lecuyer, H. Fremont, J.-P. Landesman, M.-A. Bahi. Wearout estimation using the Robustness Validation methodology for components in 150 °C ambient automotive applications. Microelectronics Reliability, 2010, 50 (Issues 9-11), pp.1744-1749. ⟨10.1016/j.microrel.2010.07.076⟩. ⟨hal-00549502⟩
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