Study of the chamber ceramic erosion of the SPT X000-ML by Optical Emission Spectroscopy and Redeposition on Silicon Substrates inside the Channel for Tooled Ceramics at Various Virtual Lifetimes - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2007
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hal-00458823 , version 1 (22-02-2010)

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Daniel Pagnon, Stéphane Pellerin, Pascal Lasgorceix, Claude Legentils. Study of the chamber ceramic erosion of the SPT X000-ML by Optical Emission Spectroscopy and Redeposition on Silicon Substrates inside the Channel for Tooled Ceramics at Various Virtual Lifetimes. 30th International Electric Propulsion Conference (IEPC 2007), Sep 2007, Florence, Italy. ⟨hal-00458823⟩
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