Study of the chamber ceramic erosion of the SPT X000-ML by Optical Emission Spectroscopy and Redeposition on Silicon Substrates inside the Channel for Tooled Ceramics at Various Virtual Lifetimes - Archive ouverte HAL
Communication Dans Un Congrès Année : 2007

Study of the chamber ceramic erosion of the SPT X000-ML by Optical Emission Spectroscopy and Redeposition on Silicon Substrates inside the Channel for Tooled Ceramics at Various Virtual Lifetimes

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Physique des plasmas [physics.plasm-ph]

Stéphane Pellerin  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-00458823

Soumis le : lundi 22 février 2010-13:55:19

Dernière modification le : jeudi 11 avril 2024-13:26:02

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hal-00458823 , version 1 (22-02-2010)

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  • HAL Id : hal-00458823 , version 1

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Daniel Pagnon, Stéphane Pellerin, Pascal Lasgorceix, Claude Legentils. Study of the chamber ceramic erosion of the SPT X000-ML by Optical Emission Spectroscopy and Redeposition on Silicon Substrates inside the Channel for Tooled Ceramics at Various Virtual Lifetimes. 30th International Electric Propulsion Conference (IEPC 2007), Sep 2007, Florence, Italy. ⟨hal-00458823⟩

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