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Article dans une revue Review of Scientific Instruments Année : 2010

Highly sensitive frequency metrology for optical anisotropy measurements

Résumé

In this paper we present a novel apparatus aimed at measuring very small birefringences and anisotropies, based on frequency metrology and not on polarimetry as usual. In our experiment, a very high finesse resonant cavity is used to convert the phase difference into a resonance frequency difference, which can then be measured with very high accuracy. We describe the set-up and present the results of experimental tests which exhibited a sensitivity dn ~ 2 x 10−18, allowing for the measurement of long-predicted magneto-electro-optical effects in gases. Since the shotnoise limited sensitivity of our apparatus lies well below the state-of-the-art sensitivity, frequency metrology appears as a promising technique for small birefringence measurements.
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Dates et versions

hal-00457551, version 1 (17-02-2010)

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Gilles G. Bailly, Raphaël Thon, Cécile Robilliard. Highly sensitive frequency metrology for optical anisotropy measurements. Review of Scientific Instruments, 2010, 81 (3), pp.033105. ⟨10.1063/1.3356731⟩. ⟨hal-00457551⟩
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