CoFIS and TELog: New downhole tools for characterizing dispersion processes in aquifers by single-well injection-withdrawal tracer tests - Archive ouverte HAL
Article Dans Une Revue Comptes Rendus Géoscience Année : 2009

CoFIS and TELog: New downhole tools for characterizing dispersion processes in aquifers by single-well injection-withdrawal tracer tests

Philippe Gouze
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Richard Leprovost
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Thierry Poidras
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Tanguy Le Borgne
Gerard Lods
Philippe Pezard
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Résumé

Contaminant migration in aquifers is one of the most debated issues in hydrogeology, as most experimental results display large deviations from the standard (asymptotic) Fickian dispersion theories. Multi-scale investigation and high-resolution sensors are required to determine the origin of non-asymptotic dispersion and validate models. For this, a set of multi-scale Single-Well Injection-Withdrawal (SWIW) tracer tests using a new dual-packer probe CoFIS, including a high resolution optical sensor TELog, are presented. When compared to standard techniques such as salinity measurements, it is shown that high-resolution optical measurements allow an improved characterization of the long-lasting non-asymptotic dispersion mechanisms.

Dates et versions

hal-00445250 , version 1 (08-01-2010)

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Philippe Gouze, Richard Leprovost, Thierry Poidras, Tanguy Le Borgne, Gerard Lods, et al.. CoFIS and TELog: New downhole tools for characterizing dispersion processes in aquifers by single-well injection-withdrawal tracer tests. Comptes Rendus Géoscience, 2009, 341 (10-11), pp.965-975. ⟨10.1016/j.crte.2009.07.012⟩. ⟨hal-00445250⟩
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