Using the SEEM software for SET testing and analysis - Archive ouverte HAL Access content directly
Book Sections Year : 2007
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hal-00397867 , version 1 (23-06-2009)

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  • HAL Id : hal-00397867 , version 1

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Vincent Pouget, Pascal Fouillat, Dean Lewis. Using the SEEM software for SET testing and analysis. Radiation Effects on Embedded Systems, Springer, pp.259-268, 2007. ⟨hal-00397867⟩
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