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Year : 2007
Frédéric Darracq : Connect in order to contact the contributor
https://hal.science/hal-00397867
Submitted on : Tuesday, June 23, 2009-2:47:58 PM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : hal-00397867 , version 1
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Vincent Pouget, Pascal Fouillat, Dean Lewis. Using the SEEM software for SET testing and analysis. Radiation Effects on Embedded Systems, Springer, pp.259-268, 2007. ⟨hal-00397867⟩
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