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Article Dans Une Revue Journal of the Optical Society of Korea Année : 2006

Third-harmonic generation microscopy for material characterization

Résumé

Third harmonic generation microscopy is described in the frame work of the theory of harmonic generation with Gaussian focused beams inside a bulk material as well as at the vicinity of an interface. This model is then applied to characterize different types of materials in terms of electronic third-order susceptibility. Examples of bulk glasses, poled glasses, laser-induced modifications in glasses and nanoparticles in solution are given in order to give a survey of the broad application field of THG microscopy in material characterization.

Domaines

Matériaux
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Dates et versions

hal-00326989 , version 1 (20-02-2024)

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Arnaud Royon, Bruno Bousquet, Lionel Canioni, Mona Tréguer-Delapierre, Thierry Cardinal, et al.. Third-harmonic generation microscopy for material characterization. Journal of the Optical Society of Korea , 2006, 10 (4), pp.188-195. ⟨10.3807/JOSK.2006.10.4.188⟩. ⟨hal-00326989⟩

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