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Article Dans Une Revue Microelectronics Reliability Année : 2004

Representation of the SiGe HBT's Thermal Impedance by Linear and Recursive Networks

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hal-00181976 , version 1 (24-10-2007)

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  • HAL Id : hal-00181976 , version 1

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Hassene Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese. Representation of the SiGe HBT's Thermal Impedance by Linear and Recursive Networks. Microelectronics Reliability, 2004, 44, pp.1. ⟨hal-00181976⟩
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