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Article Dans Une Revue International Journal of Electronics Année : 1994

Jitter measurement of an ADC by statistical analysis

Résumé

A method for measuring the jitter of an ADC based on the 'lcked histogram' test is presented, and the conditions for validation of the test as a function of the sampling position is studied. As all test bench instruments have their own independent jitter a mathematical model is used to extract the jitter of the ADC. Some experimental results are given.
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Dates et versions

hal-00179889 , version 1 (17-10-2007)

Identifiants

  • HAL Id : hal-00179889 , version 1

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Dominique Dallet, Philippe Marchegay, Mohamed Benkais. Jitter measurement of an ADC by statistical analysis. International Journal of Electronics, 1994, 77 (4), pp.517-523. ⟨hal-00179889⟩
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