Numerical reconstruction of interfacial defects and interface thermal resistances using thermal measurements
Abstract
Thermography provides an experimental mean to control the quality of interface in laminates or in coatings. It is thus important to link thermal measurements obtained on free surfaces to the possible interfacial defects. In this paper a numerical inverse method is proposed to localize and quantify the defects from measured thermal data. The identification problem leads to a non-linear minimization problem solved using gradient methods.
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