Characterization of the glass transition in vitreous silica by temperature scanning small-angle X-ray scattering - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue EPL - Europhysics Letters Année : 2005

Characterization of the glass transition in vitreous silica by temperature scanning small-angle X-ray scattering

Résumé

The temperature dependence of the x-ray scattering in the region below the first sharp diffraction peak was measured for silica glasses with low and high OH content (GE-124 and Corning 7980). Data were obtained upon scanning the temperature at 10, 40 and 80 K/min between 400 K and 1820 K. The measurements resolve, for the first time, the hysteresis between heating and cooling through the glass transition for silica glass, and the data have a better signal to noise ratio than previous light scattering and differential thermal analysis data. For the glass with the higher hydroxyl concentration the glass transition is broader and at a lower temperature. Fits of the data to the Adam-Gibbs-Fulcher equation provide updated kinetic parameters for this very strong glass. The temperature derivative of the observed X-ray scattering matches that of light scattering to within 14%.
Fichier principal
Vignette du fichier
bruening_rev2.pdf (321.29 Ko) Télécharger le fichier
Loading...

Dates et versions

hal-00004494 , version 1 (17-03-2005)

Identifiants

Citer

Ralf Brüning, Claire Levelut, Annelise Faivre, Rozenn Le Parc, Jean-Paul Simon, et al.. Characterization of the glass transition in vitreous silica by temperature scanning small-angle X-ray scattering. EPL - Europhysics Letters, 2005, 70, pp.211. ⟨hal-00004494⟩
158 Consultations
288 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More