Evaluation of electrical characteristics in fully depleted SOI MOSFETs for variable threshold voltage scheme. - Archive ouverte HAL Access content directly
Conference Papers Year : 2010

Evaluation of electrical characteristics in fully depleted SOI MOSFETs for variable threshold voltage scheme.

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hal-00604515 , version 1 (29-06-2011)

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  • HAL Id : hal-00604515 , version 1

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A. Ohata, S. Cristoloveanu. Evaluation of electrical characteristics in fully depleted SOI MOSFETs for variable threshold voltage scheme.. 6th EUROSOI Workshop, Jan 2010, Grenoble, France. ⟨hal-00604515⟩
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