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Article Dans Une Revue Journal de Physique IV Proceedings Année : 1994

Oxygen 2s spectroscopy of tin oxides with synchrotron radiation-induced photoemission

Jean-Marc Themlin
J.-M. Gilles
  • Fonction : Auteur
R. Johnson
  • Fonction : Auteur

Résumé

Oxygen 2s spectroscopy can be especially useful in studies using synchrotron radiation (SR) where the deeper O 1s level frequently can not be excited. For tin oxides (SnO and SnO2), the weak emission from the O 2s levels has been previously found degenerate with the intense photoemission peak from Sn 4d levels around a binding energy (BE) of 26 eV. By working at the Cooper minimum of the interfering tin signal, a distinct peak near BE ≈22.5 eV could be unambiguously attributed to emission from O 2s levels in tin oxides considering photoionization cross-section arguments. The O 2s intensity could now be used for the quantitative evaluation of the near-surface oxygen-species concentration. We have used the O 2s in combination with the Sn 4d areas to study the variations of the [Sn]/[O] ratio as a function of the preparation of a SnO2 single crystal. Although the dominant formal valence state for tin determined from a Sn 4d lineshape analysis remains essentially Sn4+, we show that this [Sn]/[O] ratio can vary from simple to double. This can be explained by oxygen interstitials buried in a sub-surface region during ion bombardment, which segregate at the surface upon annealing.

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jpa-00253492 , version 1 (04-02-2008)

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Jean-Marc Themlin, J.-M. Gilles, R. Johnson. Oxygen 2s spectroscopy of tin oxides with synchrotron radiation-induced photoemission. Journal de Physique IV Proceedings, 1994, 04 (C9), pp.C9-183-C9-186. ⟨10.1051/jp4:1994931⟩. ⟨jpa-00253492⟩

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