A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface - Archive ouverte HAL
Article Dans Une Revue Journal de Physique I Année : 1995

A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface

J. Heyraud
  • Fonction : Auteur
J. Bermond
  • Fonction : Auteur
Claude Alfonso
J. Métois
  • Fonction : Auteur

Résumé

A Si(111) vicinal (misorientation ≈0.6) is studied by in situ Reflection Electron Microscopy at 1173 K. A statistical study is done of the distances between pairs of mth neighbours in a step train. The mean correlated difference of the step displacements from their mean positions G(m)=<(ui-ui+m)2> is determined as a function of m. Evidence is given for the roughness of the surface. A logarithmic behaviour of G(m) versus m is demonstrated unambiguously up to m=7. Quantitative agreement is found with the theoretical predictions of Villain, Grempel and Lapujoulade. For more distant pairs of steps a different behaviour is demonstrated: G(m) increases faster than Log(m), a fact already found by another author.

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jpa-00247069 , version 1 (04-02-2008)

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J. Heyraud, J. Bermond, Claude Alfonso, J. Métois. A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface. Journal de Physique I, 1995, 5 (4), pp.443-449. ⟨10.1051/jp1:1995137⟩. ⟨jpa-00247069⟩

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