A Reflection Electron Microscopy Investigation of the Divergence of the Mean Correlated Difference of Step Displacements on a Si(111) Vicinal Surface
Résumé
A Si(111) vicinal (misorientation ≈0.6) is studied by in situ Reflection Electron Microscopy at 1173 K. A statistical study is done of the distances between pairs of mth neighbours in a step train. The mean correlated difference of the step displacements from their mean positions G(m)=<(ui-ui+m)2> is determined as a function of m. Evidence is given for the roughness of the surface. A logarithmic behaviour of G(m) versus m is demonstrated unambiguously up to m=7. Quantitative agreement is found with the theoretical predictions of Villain, Grempel and Lapujoulade. For more distant pairs of steps a different behaviour is demonstrated: G(m) increases faster than Log(m), a fact already found by another author.
Domaines
Articles anciensOrigine | Accord explicite pour ce dépôt |
---|