ANALYSIS OF STRUCTURES OF SYMMETRICAL [001] TILT GRAIN BOUNDARIES IN SILICON AND GERMANIUM - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal de Physique Colloques Année : 1990

ANALYSIS OF STRUCTURES OF SYMMETRICAL [001] TILT GRAIN BOUNDARIES IN SILICON AND GERMANIUM

J.-L. Rouviere
A. Bourret
  • Fonction : Auteur

Résumé

Using experimental results obtained by High Resolution Electron Microscopy (HREM) and numerical relaxation on Σ=5, Σ=65, Σ=13, Σ=25 and Σ=41 grain boundaries in silicon and germanium, an analysis of the structures of the symmetrical [001] tilt grain boundaries is presented. The limitation of the usual structural unit model (SUM) when applied to this material is shown. However, the efficiency of the concept of structural unit-dislocation in determining and analysing new complex structures is demonstrated.

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jpa-00230313 , version 1 (04-02-2008)

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J.-L. Rouviere, A. Bourret. ANALYSIS OF STRUCTURES OF SYMMETRICAL [001] TILT GRAIN BOUNDARIES IN SILICON AND GERMANIUM. Journal de Physique Colloques, 1990, 51 (C1), pp.C1-329-C1-334. ⟨10.1051/jphyscol:1990152⟩. ⟨jpa-00230313⟩

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