ANALYSIS OF STRUCTURES OF SYMMETRICAL [001] TILT GRAIN BOUNDARIES IN SILICON AND GERMANIUM
Résumé
Using experimental results obtained by High Resolution Electron Microscopy (HREM) and numerical relaxation on Σ=5, Σ=65, Σ=13, Σ=25 and Σ=41 grain boundaries in silicon and germanium, an analysis of the structures of the symmetrical [001] tilt grain boundaries is presented. The limitation of the usual structural unit model (SUM) when applied to this material is shown. However, the efficiency of the concept of structural unit-dislocation in determining and analysing new complex structures is demonstrated.
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