STATISTICAL ANALYSIS OF ATOM-PROBE DATA (I) : DERIVATION OF SOME FINE-SCALE FEATURES FROM FREQUENCY DISTRIBUTIONS FOR FINELY DISPERSED SYSTEMS
Résumé
A statistical model has been developed in order to predict the concentration histograms which are used in atom-probe analyses. This method allows theoretical distributions to be calculated for finely dispersed systems containing spherical particles. Some statistical methods are proposed for the interpretation of experimental histograms.
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