SURFACE EXAFS AND XANES STUDIES OF S/Ni (110) AND S/Ni (111)
Résumé
S K-edge SEXAFS were measured on c(2x2)S/Ni(110) and S/Ni(111) by monitoring the S KLL Auger intensity as a function of photon energy and polarization direction. Analysis of the data from c(2x2)S/Ni(110) gave results that a sulfur atom is located on a hollow site with R(S-top layer Ni) of (2.31±0.02) Å and R(S-bottom Ni) of (2.19±0.03) Å. These results are in close agreement with the recent analysis of LEED. From the preliminary SEXAFS work on p(2x2)S/Ni (111), S-nearest neighbor Ni bond distance was determined to be 2.20±0.04 Å.
Domaines
Articles anciens
Origine : Accord explicite pour ce dépôt
Loading...