Article Dans Une Revue Nano Letters Année : 2025

An Original Positive-Up-Negative-Down Protocol for Electrical Characterization of Antiferroelectric Materials

Résumé

This work introduces the AFE-PUND measurement method, an original positive up negative down (PUND) protocol intended to accurately study antiferroelectric (AFE) thin-film behavior. As for its FE counterpart, the AFE-PUND method isolates switching currents from nonswitching contributions, enabling a precise extraction of saturation polarization and coercive fields from hysteresis loop curves. In this paper, AFE-PUND was deployed on AFE ZrO2 films of varying thicknesses. The results reveal that saturation polarization increases with film thickness, indicating enhanced domain stability, while endurance cycles showcase the wake-up effect and its eventual fatigue-induced degradation in thicker films. Similarly, coercive fields decrease with thickness, reflecting reduced switching barriers and a sharper transition between the tetragonal and orthorhombic phases. AFE-PUND establishes itself as an extremely valuable method for advancing the understanding and optimization of AFE materials.

Fichier principal
Vignette du fichier
PUND_AFE_HAL.pdf (1.84 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Licence

Dates et versions

hal-05042560 , version 1 (22-04-2025)

Licence

Identifiants

Citer

Grégoire Magagnin, Martine Le Berre, Sara Gonzalez, Brice Gautier, Damien Deleruyelle, et al.. An Original Positive-Up-Negative-Down Protocol for Electrical Characterization of Antiferroelectric Materials. Nano Letters, In press, ⟨10.1021/acs.nanolett.5c00851⟩. ⟨hal-05042560⟩
149 Consultations
353 Téléchargements

Altmetric

Partager

  • More