Opto-RF characterization of an integrated ring resonator for the development of optoelectronic oscillators
Résumé
The generation of microwave signals with high spectral purity is essential for many applications, such as radar and telecommunications. Optoelectronic oscillators (OEOs) have been studied over the years as convenient devices for the optical generation of microwaves signals. A basic OEO typically uses a long optical fiber (several kilometers) as a delay line. However, today's systems require these devices to be integrated into photonics chips of a few square centimeters. In this context, integrated ring resonators, used as photonic filters, have emerged as compact alternatives to optical fibers. The frequency and spectral purity of the microwave signal generated by an OEO are directly linked to the Free Spectral Range (FSR) and quality factor (Q-factor) of the ring resonator. Therefore, we must first of all accurately characterize these resonators. We perform a characterization in both the optical and electrical domain to gather all information.
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