Nanoscale magnetic field mapping with a single spin scanning probe magnetometer
Résumé
We demonstrate quantitative magnetic field mapping with nanoscale resolution, by applying a lock-in technique on the electron spin resonance frequency of a single nitrogen-vacancy defect placed at the apex of an atomic force microscope tip. In addition, we report an all-optical magnetic imaging technique which is sensitive to large off-axis magnetic fields, thus extending the operation range of diamond-based magnetometry. Both techniques are illustrated by using a magnetic hard disk as a test sample. Owing to the non-perturbing and quantitative nature of the magnetic probe, this work should open up numerous perspectives in nanomagnetism and spintronics.
Mots clés
- Scanning probes
- Magnetic fields
- Test samples
- Single spin
- Lock-in technique
- Atomic force microscopy
- Imaging techniques
- Magnetometers
- Nanomagnetics
- All-optical
- Atomic force microscope (AFM)
- Electron spins
- Magnetic field mapping
- Magnetic hard disks
- Magnetic probes
- Nano scale
- Nanomagnetisms
- Nanoscale resolutions
- Off-axis
- Operation range
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