Poster De Conférence Année : 2008

Assessment of Overdamped SNS Niobium-Based Josephson Junctions for Digital Applications

Résumé

SNS Nb/Al-AlOx/Nb Josephson junctions have been recently developed with Al layer thicknesses 30- 100 nm , for which non-hysteretic I-V characteristics have been obtained by oxidation ranging from 150 to 200 Pa.s. The Stewart-McCumber parameter of the junctions can be lower or higher than unity, depending on the above-mentioned conditions. Typical Jc values of several tens of kA/cm2 and RnIc values up to 0.5-0.7 mV at 4.2 K have been obtained, suitable for digital applications. Two interesting features of this technology are: i) the absence of external shunt resistance that can allow higher integration and; ii) the reproducibility of technological parameters that is connected to a least dependence of the Josephson critical current on the barrier thickness. In this work, we will present a detailed analysis of speed and jitter that can be expected from basic digital circuits based on such a technology. This analysis is based on the accurate experimental extraction of typical quantities, like the Stewart-McCumber parameter or specific capacitance. In particular, the influence of the temperature of operation on the performance of elementary cells will be assessed. A comparison with similar cells based on externally-shunted Josephson junctions will be presented in order to evaluate the ranges of parameters for which this technology exhibits some clear advantages. In particular we will show the technological constraints that need to be met in order to build circuits that can compete with existing technologies

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Dates et versions

hal-04929298 , version 1 (04-02-2025)

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  • HAL Id : hal-04929298 , version 1

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V. Lacquaniti, N. de Leo, M. Fretto, S. Maggi, Andrea Sosso, et al.. Assessment of Overdamped SNS Niobium-Based Josephson Junctions for Digital Applications. Applied Superconductivity Conference (ASC 2008), Aug 2008, Chicago, United States. ⟨hal-04929298⟩
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