Article Dans Une Revue European Physical Journal: Applied Physics Année : 2003

Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction

J.-L. Maurice
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F. Pailloux
N. Bonnet
  • Fonction : Auteur
L. Samet
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A. Barthelemy
  • Fonction : Auteur
J.-P. Contour
  • Fonction : Auteur
A. Fert
  • Fonction : Auteur

Résumé

We use High Resolution Electron Microscopy (HRTEM) together with Electron Energy Loss Spectroscopy (EELS) to analyze the crystallography and the chemical configuration of interfaces in a state-of-the-art La2/3Sr1/3MnO3/SrTiO3/ La2/3Sr1/3MnO3 tunnel junction. EELS indicates that manganese ions keep their bulk valency up to the last atomic plane in contact with the insulator. Tunnel magnetoresistance however decreases with temperature faster than magnetisation in these samples. Quantitative HRTEM reveals some local departures from chemical abruptness at the interfaces, which could play a role in this decrease.

Dates et versions

hal-04897406 , version 1 (20-01-2025)

Identifiants

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J.-L. Maurice, F. Pailloux, D. Imhoff, N. Bonnet, L. Samet, et al.. Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction. European Physical Journal: Applied Physics, 2003, 24 (3), pp.215-221. ⟨10.1051/epjap:2003071⟩. ⟨hal-04897406⟩
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