Article Dans Une Revue Journal of Applied Physics Année : 2004

Charge dynamics of MgO single crystals subjected to KeV electron irradiation

A. Boughariou
  • Fonction : Auteur
D. Braga
  • Fonction : Auteur
A. Kallel
  • Fonction : Auteur

Résumé

The fundamental aspects of charge trapping in MgO single crystals were studied using a scanning electron microscope. The secondary electron emission (SEE) yield of uncharged MgO single crystals which were annealed at 1000°C for 2 h was also studied. It was observed that at 30 keV energy of electron irradiation, an intense electron exomission was found on the MgO orientation which was annealed at 1500°C. The transparency of the crystal to electron beam was decreased from the [110] to [100] and [111] and thus resulted in the production of secondary electrons along the escape depth which was less for the (110) crystal orientation than for the (100).

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Dates et versions

hal-04897296 , version 1 (20-01-2025)

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Citer

A. Boughariou, G. Blaise, D. Braga, A. Kallel. Charge dynamics of MgO single crystals subjected to KeV electron irradiation. Journal of Applied Physics, 2004, 95 (8), pp.4117-4124. ⟨10.1063/1.1650881⟩. ⟨hal-04897296⟩
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