Charge dynamics of MgO single crystals subjected to KeV electron irradiation
Résumé
The fundamental aspects of charge trapping in MgO single crystals were studied using a scanning electron microscope. The secondary electron emission (SEE) yield of uncharged MgO single crystals which were annealed at 1000°C for 2 h was also studied. It was observed that at 30 keV energy of electron irradiation, an intense electron exomission was found on the MgO orientation which was annealed at 1500°C. The transparency of the crystal to electron beam was decreased from the [110] to [100] and [111] and thus resulted in the production of secondary electrons along the escape depth which was less for the (110) crystal orientation than for the (100).
Mots clés
- Secondary electrons
- Anisotropy
- Annealing
- Backscattering
- Crystal orientation
- Current density
- Electric field effects
- Electron beams
- Single crystals
- Electron emission
- Secondary electron emmision (SEE)
- Crossover energies
- Charge trapping
- Transport properties
- Scanning electron microscopy
- Relaxation processes
- Polishing
- Magnesium compounds
- Insulating materials
- Electron irradiation