Communication Dans Un Congrès Année : 2024

The Use of Filtered High-Energy X-rays and 60Co for TID Testing of a 32-Bit 28nm FDSOI DSP

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hal-04892361 , version 1 (16-01-2025)

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  • HAL Id : hal-04892361 , version 1

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Alejandro Urena Acuna, Julien Favrichon, Aurélien Ballier, Pierre-Alexis Robin, Vincent Girones, et al.. The Use of Filtered High-Energy X-rays and 60Co for TID Testing of a 32-Bit 28nm FDSOI DSP. ESREF 2024 - 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2024, Parme, Italy. ⟨hal-04892361⟩
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