Development of an experimental facility for the measurement of photoinduced thermal emission in interferential filters
Résumé
In this contribution we show encouraging results of photo-induced thermal emission measurements, in nanosecond regime, for metallic layers and multilayers. The experimental setup of the instrument is presented. A comparison with the results given by numerical simulation is also highlighted, which allows to estimate the thermal parameters of thin films.
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|---|
| Licence |