THz scanning near-field microscopy of HgTe nanocrystals - Archive ouverte HAL
Communication Dans Un Congrès Année : 2024

THz scanning near-field microscopy of HgTe nanocrystals

Résumé

Far-field terahertz imaging is limited by diffraction to resolutions in the tens of micrometers range. On the other hand, near-field optical microscopy is a technique that shows permittivity contrasts at the nanoscale. We present here images of HgTe nanocrystals grown by chemical synthesis in liquid phase. The images are obtained by scattering scanning near-field microscopy at 2.52 THz and show a high contrast compared to the silicon substrate.
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Dates et versions

hal-04748630 , version 1 (22-10-2024)

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Cristiane Santos, Emmanuel Lhuillier, Edouard Lebouvier, Benjamin Walter, Marc Faucher, et al.. THz scanning near-field microscopy of HgTe nanocrystals. 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Sep 2024, Perth, Australia. pp.1-2, ⟨10.1109/IRMMW-THz60956.2024.10697628⟩. ⟨hal-04748630⟩
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