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Poster De Conférence Année : 2024

Advanced characterization techniques to inform digital twins of deformed Inconel 718 and predict plastic localization using FFT-based simulations

Sylvain Vallot
Julien Genee
Damien Texier
Denis Delagnes

Résumé

This work’s long-term objective is to assess the continuity of material deformation at the grain- and mesoscopic scale from processing to subsequent mechanical loading using crystal plasticity strain gradient models. To that end, advanced digital image correlation (HR-DIC) is performed on a pre-deformed microstructure of an Inconel 718, in order to provide plastic localization and discrete slip events necessary to instantiate simulation volumes. A numerical non-local crystal plasticity model has been developed, and implemented using FFT spectral method, to take into account initial deformation gradients and to describe their evolution under different loading conditions. Advanced experiment/simulation dialogue is expected to predict both localization of plastic strain at the sub-grain level and the macroscopic stress-strain behavior in recrystallized and pre-deformed microstructures. The process history of this latter microstructure will be purposely generated using stress-path change strategies on bi-axial specimens.
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Dates et versions

hal-04607881 , version 1 (11-06-2024)

Identifiants

  • HAL Id : hal-04607881 , version 1

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Sylvain Vallot, Julien Genee, Damien Texier, Denis Delagnes. Advanced characterization techniques to inform digital twins of deformed Inconel 718 and predict plastic localization using FFT-based simulations. EMMC19, May 2024, Madrid, Spain. . ⟨hal-04607881⟩
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