Synchrotron-based x ray fluorescence ghost imaging - Archive ouverte HAL
Article Dans Une Revue Optics Letters Année : 2023

Synchrotron-based x ray fluorescence ghost imaging

Résumé

X ray fluorescence ghost imaging (XRF-GI) was recently demonstrated for x ray lab sources. It has the potential to reduce the acquisition time and deposited dose by choosing their trade-off with a spatial resolution while alleviating the focusing constraints of the probing beam. Here, we demonstrate the realization of synchrotron-based XRF-GI: we present both an adapted experimental setup and its corresponding required computational technique to process the data. This extends the above-mentioned potential advantages of GI to synchrotron XRF imaging. In addition, it enables new strategies to improve resilience against drifts at all scales and the study of previously inaccessible samples, such as liquids.
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Dates et versions

hal-04596754 , version 1 (31-05-2024)

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Mathieu Manni, Adi Ben-Yehuda, Yishai Klein, Bratislav Lukic, Andrew Kingston, et al.. Synchrotron-based x ray fluorescence ghost imaging. Optics Letters, 2023, 48 (23), pp.6271. ⟨10.1364/ol.499046⟩. ⟨hal-04596754⟩
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