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Communication Dans Un Congrès Année : 2018

Imaging defects in an elastic waveguide using time-dependent surface data

Imagerie des défauts dans un guide d'ondes élastique à l'aide de données de surface dépendant du temps

Résumé

We are interested here in applying the Linear Sampling Method to the context of Non Destructive Testing for waveguides. Specifically the Linear Sampling Method [1] in its modal form [2] is adapted to image defects in an elastic waveguide from realistic scattering data, that is data coming from sources and receivers on the surface of the waveguide in the time domain, as it has already been done in the acoustic case [16]. The obtained method is applied to artificial data and to experimental data in the special case of back-scattering.

Dates et versions

hal-04556527 , version 1 (23-04-2024)

Identifiants

Citer

V Baronian, L Bourgeois, B Chapuis, A Recoquillay. Imaging defects in an elastic waveguide using time-dependent surface data. 8th International Conference on New Computational Methods for Inverse Problems, May 2018, Cachan, France. 012010 (7 p.), ⟨10.1088/1742-6596/1131/1/012010⟩. ⟨hal-04556527⟩
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