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Article Dans Une Revue International Journal of Infrared and Millimeter Waves Année : 2000

A criterion for using spectral interferometry in far infrared dispersion measurements

Résumé

High precision index measurements (Δn/n ≤ 10-5) have been recently achieved on an AgGaS2 crystal using a spectral interferometry technique with a polarized white-light continuum. Up to now, these measurements are limited to the visible and near-infrared range, the most dispersive domain. We investigate the possibility to extend the technique to far infrared index measurements. We demonstrate a criterion depending only on group velocity dispersion and crystal thickness for planning future experiments.

Dates et versions

hal-04457942 , version 1 (14-02-2024)

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Hervé Delbarre, Christophe Przygodzki, M. Tassou, Daniel Boucher. A criterion for using spectral interferometry in far infrared dispersion measurements. International Journal of Infrared and Millimeter Waves, 2000, 21 (6), pp.883-894. ⟨10.1023/a:1026489332723⟩. ⟨hal-04457942⟩
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