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Communication Dans Un Congrès Année : 2022

Condition monitoring and evaluation of Ron degradation during power cycling in switching mode of SiC-Mosfets power modules

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hal-04451130 , version 1 (11-02-2024)

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  • HAL Id : hal-04451130 , version 1

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Ali Ibrahim, Zoubir Khatir. Condition monitoring and evaluation of Ron degradation during power cycling in switching mode of SiC-Mosfets power modules. 12th International Conference on Integrated Power Electronics Systems (CIPS 2022), Mar 2022, Berlin, Germany. ⟨hal-04451130⟩
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