Journal Articles
Journal of Electronic Materials
Year : 2016
Bilel HAFSI : Connect in order to contact the contributor
https://hal.science/hal-04422392
Submitted on : Sunday, January 28, 2024-6:42:43 PM
Last modification on : Tuesday, June 4, 2024-1:26:03 PM
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B. Hafsi, A. Boubaker, David Guérin, S. Lenfant, A. Kalboussi, et al.. Traps and Interface Fixed Charge Effects on a Solution-Processed n-Type Polymeric-Based Organic Field-Effect Transistor. Journal of Electronic Materials, 2016, 46 (2), pp.1128-1136. ⟨10.1007/s11664-016-5067-3⟩. ⟨hal-04422392⟩
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