Structural evolution and charge storage mechanism of sputtered LiMn15Ni1,5O4 thin films by X-ray diffraction and Raman spectroscopy - Archive ouverte HAL
Conference Papers Year : 2021

Structural evolution and charge storage mechanism of sputtered LiMn15Ni1,5O4 thin films by X-ray diffraction and Raman spectroscopy

No file

Dates and versions

hal-04410870 , version 1 (22-01-2024)

Identifiers

  • HAL Id : hal-04410870 , version 1

Cite

Ankush Bhatia, Clément Leviel, Maxime Hallot, Jean Pierre Pereira-Ramos, C. Lethien, et al.. Structural evolution and charge storage mechanism of sputtered LiMn15Ni1,5O4 thin films by X-ray diffraction and Raman spectroscopy. European Materials Research Society Spring meeting (EMRS 2021), May 2021, Virtual - Online, France. ⟨hal-04410870⟩
28 View
0 Download

Share

More