Structural evolution and charge storage mechanism of sputtered LiMn15Ni1,5O4 thin films by X-ray diffraction and Raman spectroscopy - Archive ouverte HAL
Communication Dans Un Congrès Année : 2021

Structural evolution and charge storage mechanism of sputtered LiMn15Ni1,5O4 thin films by X-ray diffraction and Raman spectroscopy

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Chimie
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hal-04410870 , version 1 (22-01-2024)

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  • HAL Id : hal-04410870 , version 1

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Ankush Bhatia, Clément Leviel, Maxime Hallot, Jean Pierre Pereira-Ramos, C. Lethien, et al.. Structural evolution and charge storage mechanism of sputtered LiMn15Ni1,5O4 thin films by X-ray diffraction and Raman spectroscopy. European Materials Research Society Spring meeting (EMRS 2021), May 2021, Virtual - Online, France. ⟨hal-04410870⟩
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