Electro-Thermal Investigation of SiGe HBTs: A Review
Résumé
This paper presents a review on the electro-thermal investigation of SiGe HBT technologies. After introducing a simple method of measuring thermal resistance (RTH), analytical studies on the calculation of RTH is discussed and subsequently the contribution of the back-end-of-line metal lines is estimated. Based on this analysis, strategies for the optimum emitter finger placements while designing a power amplifier cell are investigated. Finally, the thermal impedance measurement and modelling aspects are discussed.
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