Measurement of Self-Heating Temperature in AlGaN/GaN HEMTs by Using Cerium Oxide Micro-Raman Thermometers - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Electron Devices Année : 2019
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hal-04408061 , version 1 (21-01-2024)

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G. Brocero, Y. Guhel, P. Eudeline, J. Sipma, C. Gaquiere, et al.. Measurement of Self-Heating Temperature in AlGaN/GaN HEMTs by Using Cerium Oxide Micro-Raman Thermometers. IEEE Transactions on Electron Devices, 2019, 66 (10), pp.4156-4163. ⟨10.1109/TED.2019.2935335⟩. ⟨hal-04408061⟩
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