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Poster De Conférence Année : 2022

In – depth chemical and optoelectronic analysis of triple-cation perovskite thin films by combining XPS profiling and PL Imaging

Guillaume Vidon
Philip Schulz
Arnaud Etcheberry

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Chimie
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Dates et versions

hal-04401760 , version 1 (17-01-2024)

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  • HAL Id : hal-04401760 , version 1

Citer

Pia Dally, Stefania Cacovich, Mirella Al Katrib, Guillaume Vidon, Marie Legrand, et al.. In – depth chemical and optoelectronic analysis of triple-cation perovskite thin films by combining XPS profiling and PL Imaging. Journées Nationales des Spectroscopies de PhotoEmission 2022 (JNSPE 2022), May 2022, Dijon, France. . ⟨hal-04401760⟩
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