Self-Trapping Relaxation Decay Investigated by Time-Resolved Photoelectron Spectroscopy - Archive ouverte HAL Access content directly
Conference Papers Year : 2018
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hal-04358056 , version 1 (21-12-2023)

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  • HAL Id : hal-04358056 , version 1

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Aude Lietard, Giovanni Piani, Marc Briant, Marc-André Gaveau, Sylvain Faisan, et al.. Self-Trapping Relaxation Decay Investigated by Time-Resolved Photoelectron Spectroscopy. AMOC 2018, Apr 2018, Budapest, Hungary. ⟨hal-04358056⟩
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