Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Electron Devices Year : 2023

Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs

Bogdan Cretu
Anabela Veloso
Eddy Simoen

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hal-04335878 , version 1 (11-12-2023)

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Bogdan Cretu, Anabela Veloso, Eddy Simoen. Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs. IEEE Transactions on Electron Devices, 2023, 70 (1), pp.254-260. ⟨10.1109/TED.2022.3225248⟩. ⟨hal-04335878⟩
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