Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Electron Devices Année : 2023

Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs

Bogdan Cretu
Anabela Veloso
Eddy Simoen

Dates et versions

hal-04335878 , version 1 (11-12-2023)

Identifiants

Citer

Bogdan Cretu, Anabela Veloso, Eddy Simoen. Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs. IEEE Transactions on Electron Devices, 2023, 70 (1), pp.254-260. ⟨10.1109/TED.2022.3225248⟩. ⟨hal-04335878⟩
3 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More