0.7-$\mu$ m InP DHBT Technology With 400-GHz ${f}_{{T}}$ and ${f}_{\text{MAX}}$ and 4.5-V BV CE0 for High Speed and High Frequency Integrated Circuits
Résumé
We report the performances of a 0.7-μm InP/GaInAs DHBT developed in III-V Lab demonstrating both f T and f MAX of 400 GHz as well as a high fabrication yield and homogeneity on a 3-inch wafer. This technology is used for the fabrication of a very high speed 2:1 multiplexing selector operating up to 212-Gb/s, establishing a speed record. A 5.4-Vpp 100-Gb/s distributed differential selector-driver, as well as a 4.3-Vpp 64-GBd 8-pulse-amplitude-modulation (PAM) (192 Gb/s) high-speed power digital-to-analog converter (DAC) were also realized in this technology.
Mots clés
Heterojunction bipolar transistor
InP/GaInAs DHBT
integrated circuits
Indium phosphide
III-V semiconductor materials
DH-HEMTs
Indium gallium arsenide
Fabrication
Thermal resistance
digital-analogue conversion
driver circuits
gallium arsenide
heterojunction bipolar transistors
III-V semiconductors
indium compounds
pulse amplitude modulation
submillimetre wave integrated circuits